PLC

350022M BENTLY

3500/22M Transient Data Interface Module
Class I,Zone 2:AEx/Ex nA nC ic lIC
T4 GC:
Class lZone 2:AEx/Exec nC ic lIC
T4 GC;
Class Division 2,Groups ABC
and D;
T4 @Ta=-20C to +65℃(-4Fto
+149F)
or 149244.
国113G
Ex nA nC ic lIC T4 GC
Ex ec nC ic lIC T4/T5 Gc
T4 @Ta=-20Cto+65°C(-4°Fto
+14

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350022M BENTLY

The 3500/22M Transient Data Interface (TDI) is the interfacebetween the 3500 monitoring system and compatiblesoftware (System 1 Condition Monitoring and Diagnosticsoftware and 3500 System Configuration software). The TDIcombines the function of a 3500/20 Rack Interface Module(RIM) with the data collection capability of a communicationprocessor such as TDXnet.The TDI resides in the slot adjacent to the power supplies of a3500 rack. It interfaces with M series monitors (3500/40M,3500/42M, etc.) to continuously collect steady state andtransient dynamic (waveform) data and pass this data throughan Ethernet link to the host software. Refer to theCompatibility section at the end of this document for moreinformation.Static data capture capability is standard with the TDI.However, using an optionalChannel Enabling Disk will allowthe TDI to capture dynamic and high-resolution transient dataas well. The TDI incorporates the communication processorfunction within the 3500 rack.

3500/22M Transient Data Interface Module
Class I,Zone 2:AEx/Ex nA nC ic lIC
T4 GC:
Class lZone 2:AEx/Exec nC ic lIC
T4 GC;
Class Division 2,Groups ABC
and D;
T4 @Ta=-20C to +65℃(-4Fto
+149F)
or 149244.
国113G
Ex nA nC ic lIC T4 GC
Ex ec nC ic lIC T4/T5 Gc
T4 @Ta=-20Cto+65°C(-4°Fto
+14

3500 22M Dynamic Data Enabling
Disk
This disk enables the number of channels ofdynamic data (i.e., the ability to collectwaveforms) that the TDI will support. There aretwo levels of dynamic data. Steady-State pointsare channels that collect waveform data dueeither to a software command or to an alarmevent, and therefore support current values,scheduled waveform capture, and alarm datacapture. Transient points provide all thefunction of a Steady-State point with theadditional capability of waveform collectiondue to parameter variations such as machinespeed.

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